Active Near-Field Optical Microscopy

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dc.contributor.author Le Gac, Gaelle en_US
dc.contributor.author Rahmani, Adel en_US
dc.contributor.author Seassal, Christian en_US
dc.contributor.author Picard, Emmanuel en_US
dc.contributor.author Hadji, Emmanuel en_US
dc.contributor.author Callard, Segolene en_US
dc.contributor.editor IEEE en_US
dc.date.accessioned 2010-05-28T09:58:31Z
dc.date.available 2010-05-28T09:58:31Z
dc.date.issued 2008 en_US
dc.identifier 2008006650 en_US
dc.identifier.citation Le Gac Gaelle et al. 2008, 'Active Near-Field Optical Microscopy', IEEE, New York, USA, pp. 1-2. en_US
dc.identifier.issn 978-1-55752-859-9 en_US
dc.identifier.other E1UNSUBMIT en_US
dc.identifier.uri http://hdl.handle.net/10453/10685
dc.description.abstract Near-field probe was used to tune the resonance wavelength of a linear cavity. Theoritical and experimental study are presented to show the effect of the probe material on the cavity resonance en_US
dc.language en_US
dc.publisher IEEE en_US
dc.relation.isbasedon NA en_US
dc.title Active Near-Field Optical Microscopy en_US
dc.parent 2008 Conference On Lasers And Electro-Optics & Quantum Electronics And Laser Science Conference en_US
dc.journal.volume en_US
dc.journal.number en_US
dc.publocation New York, USA en_US
dc.identifier.startpage 1 en_US
dc.identifier.endpage 2 en_US
dc.cauo.name SCI.Mathematical Sciences en_US
dc.conference Verified OK en_US
dc.for 020500 en_US
dc.personcode 0000052023 en_US
dc.personcode 101667 en_US
dc.personcode 0000043240 en_US
dc.personcode 0000052025 en_US
dc.personcode 0000052024 en_US
dc.personcode 0000043243 en_US
dc.percentage 70 en_US
dc.classification.name Optical Physics en_US
dc.classification.type FOR-08 en_US
dc.edition en_US
dc.custom Conference On Lasers And Electro-Optics & Quantum Electronics And Laser Science Conference en_US
dc.date.activity 20080504 en_US
dc.location.activity San Jose, USA en_US
dc.description.keywords optical microscopy en_US


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