http://hdl.handle.net/10453/155 2013-06-20T12:01:14Z http://hdl.handle.net/10453/11785 EBSD Investigations of Equal Channel Angular Extruded Copper Wuhrer Richard; Meijer Elisabeth; Yeung Wing; Attard D Development of nano- and submicron-structured materials has attracted significant research interest in the last ten years [1, 2]. Most recently, an innovative technology called the Equal Channel Angular Extrusion (ECAE) process has demonstrated its capability of producing nano- and submicronstructured metallic alloys with substantial strength improvement [3-8]. ECAE adopts the principle of mechanical attrition and imposes very heavy shear deformation on bulk materials without causing major dimensional changes of the extruded products [3]. It has been suggested that this technology has great advantages over the conventional mechanical attrition of ball milling because it can produce large sized samples free of any residual porosity. 2007-01-01T00:00:00Z http://hdl.handle.net/10453/11784 Imaging Fundamental Electronic Excitations at High Spatial Resolution Using Scanning Cathodoluminescence Microscopy Phillips Matthew; Drouin Dominique; Moody Steven; Ton-That Cuong NA 2009-01-01T00:00:00Z http://hdl.handle.net/10453/11783 Spectral Imaging and X-Ray Microanalysis with Multiple Detectors Wuhrer Richard; Moran Ken We have progressively refined our requirements for high quality x-ray mapping, which has been a process of learning, advancing our hardware and redefining our requirements. Mapping is not a simple `one size fits all¿ scenario. There are still simple applications where dot mapping, especially with a wavelength dispersive spectrometer, can achieve the required results. The good thing about mapping is that there is always something new that can be learned and we are continually pushing back the boundaries of what can be achieved with mapping. It won¿t be far into the future that we will have an electron microscope specifically set up to do live x-ray imaging, as we now do for electron imaging. The biggest problem we face is one of being able to determine the level of sophistication in our treatment of the data collected. As with automatic peak identification and standardless analysis it is very easy to produce bad results [1]. The good news is that if you are prepared to set your system up for high quality standards analysis, then most of these problems disappear. 2007-01-01T00:00:00Z http://hdl.handle.net/10453/8412 Comparison of Low Voltage Cathodoluminescent Phosphors Phillips Matthew; Drouin Dominique NA 2006-01-01T00:00:00Z