Ton-That Cuong; Shard Alex; Teare D.; Bradley R.
(Elsevier Ltd, 2001)
Films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) blends of two different thicknesses have been examined by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Blends with different ...