Fialin Michel; Remond Guy; Nockolds Clive; Myklebust Robert; Phillips Matthew; Roques-Carmes Claude
(US Government Printing Office, 2002)
Line shapes of atomic lines and soft
x-ray emission bands measured with a
wavelength dispersive spectrometer
(WDS) with the Electron Probe Micro
Analyzer (EPMA) are reviewed. Least
square fitting to pseudo-Voigt ...