Bradby, J.; Kucheyev, S. O.; Williams, J. S.; Wong-Leung, J.; Swain, M. V.; Munroe, P.; Li, G., Phillips, M. R.
(American Institute of Physics, 2002)
The mechanical deformation of wurtzite GaN epilayers grown on sapphire substrates is studied by
spherical indentation, cross-sectional transmission electron microscopy (XTEM), and scanning
cathodoluminescence (CL) ...